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Statistical concepts of capability of detection
Author(s) -
Wilrich PeterTh.
Publication year - 2002
Publication title -
applied stochastic models in business and industry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.413
H-Index - 40
eISSN - 1526-4025
pISSN - 1524-1904
DOI - 10.1002/asmb.483
Subject(s) - value (mathematics) , statistics , calibration , mathematics , sample (material) , sample size determination , computer science , physics , thermodynamics
The minimum detectable value of a measurement system is the smallest true value of the measurand X that can be detected as distinct from the true value x = 0 with a specified probability 1 −β . If the measurand X is measured indirectly and the directly measurable variable Y is linearly related to X , the minimum detectable value depends on the design of the measurement system, i.e. the calibration experiment for the estimation of the linear relationship and the number of repeated measurements of the sample. In this paper a design is derived that assures the minimum detectable value to be equal to a specified value. Copyright © 2002 John Wiley & Sons, Ltd.