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On fail‐safe systems under random shocks
Author(s) -
Zhang Yiying,
AminiSeresht Ebrahim,
Zhao Peng
Publication year - 2018
Publication title -
applied stochastic models in business and industry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.413
H-Index - 40
eISSN - 1526-4025
pISSN - 1524-1904
DOI - 10.1002/asmb.2349
Subject(s) - reliability (semiconductor) , hazard , computer science , econometrics , mathematics , physics , power (physics) , chemistry , organic chemistry , quantum mechanics
In practical situations, systems often suffer shocks from external stressing environments, stressing the system at random. These random shocks may have non‐ignorable effects on the system's reliability. In this paper, we provide sufficient (and necessary) conditions on components' lifetimes and their surviving probabilities from random shocks for comparing the lifetimes of two fail‐safe systems by means of the usual stochastic, hazard rate, and likelihood ratio orderings. Numerical examples are presented to highlight these theoretical results as well.