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An optimal burn‐in policy based on a degradation model
Author(s) -
Mosayebi Omshi E.,
Shemehsavar S.
Publication year - 2018
Publication title -
applied stochastic models in business and industry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.413
H-Index - 40
eISSN - 1526-4025
pISSN - 1524-1904
DOI - 10.1002/asmb.2314
Subject(s) - burn in , piecewise linear function , degradation (telecommunications) , mathematical optimization , computer science , test (biology) , path (computing) , function (biology) , process (computing) , piecewise , operations research , mathematics , reliability engineering , engineering , telecommunications , paleontology , mathematical analysis , geometry , evolutionary biology , biology , programming language , operating system
Burn‐in tests help manufacturers detect defective items and remove them before being sold to customers. In a competitive marketplace, cost is a major consideration and not employing a burn‐in test may result in higher and needless expenses. With this in mind, we consider degradation‐based burn‐in tests in which the degradation path follows a Wiener process and weak items are identified when the process crosses a piecewise linear function. We also study linear functions as a special case of such a piecewise linear barrier. Within this setup, we apply a cost model to determine the optimal burn‐in test. Finally, we discuss an illustrative example using GaAs laser degradation data and present an optimal burn‐in test for it.