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An information‐based burn‐in procedure for minimally repaired items from mixed population
Author(s) -
Cha Ji Hwan,
Badía F. G.
Publication year - 2016
Publication title -
applied stochastic models in business and industry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.413
H-Index - 40
eISSN - 1526-4025
pISSN - 1524-1904
DOI - 10.1002/asmb.2176
Subject(s) - burn in , reliability (semiconductor) , point (geometry) , computer science , probabilistic logic , reliability engineering , population , operations research , mathematical optimization , mathematics , medicine , engineering , artificial intelligence , power (physics) , physics , geometry , environmental health , quantum mechanics
Burn‐in is a method used to eliminate the initial failures in field use. In this paper, we will consider an information‐based burn‐in procedure for repairable items, which is completely new type of burn‐in procedure. By this procedure, based on the operational (failure and repair) history of the items observed during burn‐in procedure, those with poor reliability performance are eliminated. From a probabilistic point of view, this burn‐in procedure utilizes the information contained in the ‘random paths’ of the corresponding point processes. A general formulation of the model will be suggested, and under the suggested framework, two‐stage optimization procedure for determining optimal burn‐in procedures will be studied in detail. Copyright © 2016 John Wiley & Sons, Ltd.