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Creep and hysteresis compensation for nanomanipulation using atomic force microscope
Author(s) -
Yang Qinmin,
Jagannathan S.
Publication year - 2009
Publication title -
asian journal of control
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.769
H-Index - 53
eISSN - 1934-6093
pISSN - 1561-8625
DOI - 10.1002/asjc.94
Subject(s) - creep , control theory (sociology) , hysteresis , offset (computer science) , actuator , compensation (psychology) , computer science , physics , control (management) , artificial intelligence , thermodynamics , condensed matter physics , psychology , psychoanalysis , programming language
In this paper, a novel scheme is presented to simultaneously compensate the inherent creep and hysteresis nonlinearities of a piezoelectric actuator while positioning the Atomic Force Microscope (AFM) tip. In order to mitigate these nonlinearities, creep and hysteresis phenomenon are first modeled separately by using the classical Prandtl‐Ishlinskii (PI) operator. Then, a linear time‐invariant (LTI) representation is obtained to identify the creep uncertainty and subsequently an adaptive control scheme is devised for the piezoelectric actuator to track a desired path in the presence of creep. An additional dynamic inversion loop is utilized by using an online approximator to offset the hysteresis effects without the need of identifying the parameters within the hysteresis model. Rigorous performance analysis is conducted using standard Lyapunov stability approach along with simulation results. Copyright © 2009 John Wiley and Sons Asia Pte Ltd and Chinese Automatic Control Society