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Special Issue on “Recent Emerging Technologies in Atomic Force Microscopy”
Publication year - 2015
Publication title -
asian journal of control
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.769
H-Index - 53
eISSN - 1934-6093
pISSN - 1561-8625
DOI - 10.1002/asjc.1135
Subject(s) - citation , atomic force microscopy , computer science , product (mathematics) , nanotechnology , library science , mathematics , materials science , geometry
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