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Cover Image, Volume 138, Issue 45
Author(s) -
Lyu Lingyun,
Hanada Takeshi,
Yamahira Naohiro,
Morita Jun,
Yamamoto Ryota,
Itomi Ken,
Adachi Takumi,
Kubouchi Sho,
Horiuchi Shin
Publication year - 2021
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.51585
Subject(s) - natural rubber , materials science , scanning transmission electron microscopy , electron tomography , dark field microscopy , tomography , scanning electron microscope , optics , composite material , microscopy , physics
The cover image by Shin Horiuchi and co‐authors shows how the distribution of nano‐sized silica in binary rubber blends is characterized by scanning transmission electron microscopy (STEM) tomography, combined with energy dispersive X‐ray spectrometry (EDX). 3D distribution of silica, is visualized by STEM‐EDX tomography. The phase‐separated morphologies of polyisoprene rubber (IR) and styrene‐butadiene rubber (SBR) meanwhile is visualized by STEM‐tomography in high‐angleannular‐dark field (HAADF) mode. The combination of STEM‐EDX and STEM‐HAADF tomography determines the distribution of silica between the two rubber phases quantitatively. The silica in IR (light blue) and in SBR (dark blue) phases can be identified as yellow and pink regions, respectively. DOI: 10.1002/app.51443