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Fumed SiO 2 nanoparticle reinforced biopolymer blend nanocomposites with high dielectric constant and low dielectric loss for flexible organic electronics
Author(s) -
Deshmukh Kalim,
Ahamed M. Basheer,
Sadasivuni Kishor Kumar,
Ponnamma Deepalekshmi,
AlMaadeed Mariam AlAli,
Deshmukh Rajendra R.,
Pasha S. K. Khadheer,
Polu Anji Reddy,
Chidambaram K.
Publication year - 2017
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.44427
Subject(s) - materials science , nanocomposite , dielectric , fourier transform infrared spectroscopy , dielectric loss , fumed silica , vinyl alcohol , nanoparticle , thermogravimetric analysis , chemical engineering , high κ dielectric , composite material , polymer , nanotechnology , optoelectronics , engineering
In the present study, fumed silica (SiO 2 ) nanoparticle reinforced poly(vinyl alcohol) (PVA) and poly(vinylpyrrolidone) (PVP) blend nanocomposite films were prepared via a simple solution‐blending technique. Fourier transform infrared spectroscopy (FTIR), ultraviolet–visible spectroscopy (UV–vis), X‐ray diffraction (XRD), and scanning electron microscopy (SEM) were employed to elucidate the successful incorporation of SiO 2 nanoparticles in the PVA/PVP blend matrix. A thermogravimetric analyzer was used to evaluate the thermal stability of the nanocomposites. The dielectric properties such as dielectric constant (ɛ) and dielectric loss (tan δ) of the PVA/PVP/SiO 2 nanocomposite films were evaluated in the broadband frequency range of 10 −2 Hz to 20 MHz and for temperatures in the range 40–150 °C. The FTIR and UV–vis spectroscopy results implied the presence of hydrogen bonding interaction between SiO 2 and the PVA/PVP blend matrix. The XRD and SEM results revealed that SiO 2 nanoparticles were uniformly dispersed in the PVA/PVP blend matrix. The dielectric property analysis revealed that the dielectric constant values of the nanocomposites are higher than those of PVA/PVP blends. The maximum dielectric constant and the dielectric loss were 125 (10 −2 Hz, 150 °C) and 1.1 (10 −2 Hz, 70 °C), respectively, for PVA/PVP/SiO 2 nanocomposites with 25 wt % SiO 2 content. These results enable the preparation of dielectric nanocomposites using a facile solution‐casting method that exhibit the desirable dielectric performance for flexible organic electronics. © 2016 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2017 , 134 , 44427.