Premium
Bright field and dark field STEM‐IN‐SEM imaging of polymer systems
Author(s) -
Patel Binay,
Pearson Raymond,
Watanabe Masashi
Publication year - 2014
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.40851
Subject(s) - scanning transmission electron microscopy , materials science , scanning electron microscope , dark field microscopy , polymer , microstructure , ceramic , nanotechnology , composite material , optics , microscopy , physics
The microstructural analysis of polymer systems (e.g., polymers and their composites) has largely been conducted by transmission electron microscopy (TEM). However, hard materials (e.g., metals and ceramics) are better suited for TEM imaging because such materials can withstand the high energy electron beam generated in TEM instruments. Recently, scanning TEM in scanning electron microscopy (STEM‐IN‐SEM) has emerged as a viable alternative to TEM imaging of polymer systems. STEM‐IN‐SEM uses a versatile and user‐friendly SEM instrument for examining the microstructure of polymer systems. In this study, we outline our method for STEM‐IN‐SEM imaging and apply it to the imaging of various commercial and model polymer systems. Imaging results are evaluated on the basis of measured signal intensity, which compare favorably to microstructural analysis using more costly TEM and STEM instruments. Furthermore, these comparable signal intensities are achieved through STEM‐IN‐SEM imaging with specimens that are three times thicker than those required for conventional TEM imaging. In this respect, as compared to TEM, STEM‐IN‐SEM offers faster specimen preparation times coupled with easier usability and lower maintenance costs, which are all attractive attributes for efficient quality control measures in industry. © 2014 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2014 , 131 , 40851.