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The role of dislocations for the plastic deformation of semicrystalline polymers as investigated by multireflection X‐ray line profile analysis
Author(s) -
Spieckermann Florian,
Polt Gerald,
Wilhelm Harald,
Kerber Michael,
Schafler Erhard,
Zehetbauer Michael J.
Publication year - 2012
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.36570
Subject(s) - materials science , tacticity , crystallinity , deformation (meteorology) , dislocation , synchrotron , composite material , amorphous solid , polymer , phase (matter) , polypropylene , dislocation creep , crystallography , optics , physics , chemistry , polymerization , quantum mechanics
Abstract Wide angle X‐ray experiments evaluated by recent developments of X‐ray line profile analysis allow for the detection of the presence of dislocations as well as to determine their density in crystalline materials. The application to semicrystalline polymers not only provides information on the crystal size and the dislocations but—in combination with in situ deformation—also information on the evolution of these microstructural parameters. Investigations on cold rolled and on uniaxially compressed samples of α‐phase isotactic polypropylene (α‐iPP) as well as poly(3‐hydroxybutyrate) (P3HB) are presented. The synchrotron experiments reveal a dislocation governed deformation process in α‐iPP. P3HB, however, deforms by a process not including dislocation generation. Here, microcracking and strain localization in the amorphous phase seem to be the predominant deformation mechanisms. © 2012 Wiley Periodicals, Inc. J Appl Polym Sci, 2012