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Dielectric relaxation behavior of conducting carbon black reinforced ethylene acrylic elastomer vulcanizates
Author(s) -
Sahoo B. P.,
Naskar K.,
Choudhary R. N. P.,
Sabharwal S.,
Tripathy D. K.
Publication year - 2011
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.35049
Subject(s) - materials science , composite material , carbon black , elastomer , percolation threshold , dielectric , percolation (cognitive psychology) , dielectric loss , dissipation factor , relaxation (psychology) , electrical resistivity and conductivity , natural rubber , psychology , social psychology , optoelectronics , engineering , neuroscience , electrical engineering , biology
The dielectric relaxation characteristics of conductive carbon black (CCB) reinforced ethylene acrylic elastomer (AEM) vulcanizates have been studied as a function of frequency (10 1 –10 6 Hz) at different filler loading over a wide range of temperatures (30–120°C). The effect of filler loadings on the dielectric permittivity (ε′), loss tangent (tan δ), complex impedance ( Z *), and electrical conductivity (σ ac ) were studied. The variation of ε′ with filler loading has been explained based on the interfacial polarization of the fillers within a heterogeneous system. The effect of filler loading on the imaginary ( Z ″) and real ( Z ′) part of Z * were distinctly visible, which may be due to the relaxation dynamics of polymer chains at the polymer–filler interface. The frequency dependency of σ ac has been investigated using percolation theory. The phenomenon of percolation in the composites has been discussed in terms of σ ac . The percolation threshold (ϕ crit ) occurred in the range of 20–30 phr (parts per hundred) of filler loading. The effect of temperature on tan δ, ε′, σ ac , and Nyquist plots of CCB‐based AEM vulcanizates has been investigated. The CCB was uniformly dispersed within the AEM matrix as studied from the transmission electron microscope (TEM) photomicrographs. © 2011 Wiley Periodicals, Inc. J Appl Polym Sci, 2012