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The Van der Pauw method for sheet resistance measurements of polypyrrole‐coated para‐aramide woven fabrics
Author(s) -
Banaszczyk J.,
Schwarz A.,
De Mey G.,
Van Langenhove L.
Publication year - 2010
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.32186
Subject(s) - van der pauw method , polypyrrole , materials science , microelectronics , composite material , sheet resistance , coating , polymer chemistry , nanotechnology , layer (electronics) , polymer , electrical engineering , electrical resistivity and conductivity , engineering , polymerization , hall effect
In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole‐coated woven para‐aramide fabrics and used a simple setup to measure their sheet resistances. The results were then compared with those obtained using a sophisticated commercial collinear array probe. The measurements were done in a 1 month interval, to investigate the influence of the coating aging on the sheet resistance of the samples. The influence of the contact positioning on the accuracy of the VDP measurement was investigated. © 2010 Wiley Periodicals, Inc. J Appl Polym Sci, 2010