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Weibull statistics in electrical aging of polyesterimide under AC voltage
Author(s) -
Nedjar Mohammed,
Beroual Abderrahmane
Publication year - 2010
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.31509
Subject(s) - weibull distribution , statistical analysis , materials science , dispersion (optics) , voltage , composite material , degradation (telecommunications) , mechanics , electrical engineering , mathematics , statistics , physics , engineering , optics
This article is aimed at the investigation of electrical aging of polyesterimide under AC voltage using Weibull statistical analysis. It's shown that the time to breakdown characteristic ( V – t ) of polyesterimide includes two zones (segments of straight line). The first zone characterizes a statistical dispersion of the intrinsic defects of material. The second zone expresses the real aging of polymer. The variation of the slope of lifetime curve is attributed to the change in the degradation mechanism. © 2010 Wiley Periodicals, Inc. J Appl Polym Sci, 2010