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Microstructural parameters in electron‐irradiated C108 silk fibers by wide‐angle X‐ray scattering studies
Author(s) -
Asha S.,
Sanjeev Ganesh,
Subramanya G.,
Parameswara P.,
Somashekar R.
Publication year - 2009
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.31312
Subject(s) - silk , materials science , crystallite , irradiation , scattering , electron beam processing , wide angle x ray scattering , polymer , composite material , analytical chemistry (journal) , polymer chemistry , small angle neutron scattering , optics , chemistry , neutron scattering , physics , nuclear physics , chromatography , metallurgy
Abstract The present study looks into the microstructural changes in C108 ( Bombyx mori ) silk fibers, induced by electron irradiation. The irradiation process was performed in air at room temperature by the use of 8 MeV electron accelerators at different doses: 0, 25, 50, 75, and 100 kGy, respectively. The changes in microstructural parameters in these natural polymer fibers have been studied using wide‐angle X‐ray scattering method. The crystal imperfection parameters such as crystallite size 〈 N 〉, lattice strain ( g in %), and enthalpy (α*) have been determined by line profile analysis using Fourier method of Warren. Exponential, lognormal, and Reinhold functions for the column length distributions have been used for the determination of these parameters. © 2009 Wiley Periodicals, Inc. J Appl Polym Sci, 2010