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Preparation and characterization of thin films of the poly( p ‐phenylene vinylene) semiconducting polymer
Author(s) -
Gomathi N.,
Prasad Venkata K.,
Neogi Sudarsan
Publication year - 2008
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.29208
Subject(s) - materials science , spin coating , polymer , phenylene , fourier transform infrared spectroscopy , characterization (materials science) , thin film , scanning electron microscope , diffraction , polymer chemistry , poly(p phenylene vinylene) , poly(p phenylene) , conjugated system , chemical engineering , nanotechnology , optics , composite material , physics , engineering
Abstract Conjugated polymers have been the subject of many studies because of their widespread applications in electronic and optoelectronic devices. Poly( p ‐phenylene vinylene) is a leading semiconducting polymer in optical applications. This work is focused on the development of thin films of poly( p ‐phenylene vinylene) by spin coating and their characterization with Fourier transform infrared spectroscopy, X‐ray diffraction, and scanning electron microscopy to understand their changes. An empirical model has been developed to show the effect of the variables—the spin speed, polymer concentration, and spin time—on the film thickness. © 2008 Wiley Periodicals, Inc. J Appl Polym Sci, 2009