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Using field theory to measure surface resistivity of high‐resistance polymeric films
Author(s) -
Tsai Peter P.,
Bresee Randall R.
Publication year - 2001
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.2140
Subject(s) - ohm , electrical resistivity and conductivity , materials science , ohm's law , electric field , electrode , resistive touchscreen , electrical resistance and conductance , measure (data warehouse) , composite material , condensed matter physics , magnetic field , sheet resistance , electrical engineering , physics , engineering , computer science , quantum mechanics , database , layer (electronics)
Theoretical expressions based on Ohm's law for field theory were derived to measure surface resistivity of high‐resistance polymer films using parallel plate and concentric circular electrodes. Experimental measurements of resistivity were compared to experimental measurements using conventional expressions based on Ohm's law for circuit theory. Expressions based on Ohm's law for circuit theory were found to be inadequate for measuring surface resistivity. The surface resistivity of high‐resistance films can be accurately measured if electric field theory is used to include the effects of electrode structure, if relative humidity (RH) and temperature are controlled, if the level of applied voltage is limited, and if the measuring system is shielded from extraneous electric and magnetic fields. © 2001 John Wiley & Sons, Inc. J Appl Polym Sci 82: 2856–2862, 2001