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Structure and electrical properties of the oriented polyaniline films
Author(s) -
Wan Meixiang,
Li Ming,
Li Junchao,
Liu Zhenxing
Publication year - 1994
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1994.070530201
Subject(s) - polyaniline , conductivity , materials science , variable range hopping , x ray photoelectron spectroscopy , electrical resistivity and conductivity , anisotropy , fourier transform infrared spectroscopy , diffraction , protonation , atmospheric temperature range , elongation , analytical chemistry (journal) , polymer chemistry , composite material , chemical engineering , chemistry , polymer , physics , thermal conduction , optics , thermodynamics , organic chemistry , ion , quantum mechanics , engineering , polymerization , ultimate tensile strength
The structure of oriented polyaniline (PANI) films were characterized by elemental analysis, FTIR, XPS, SEM, and X‐ray diffraction, and their electrical properties were measured as a function of the protonation state, elongation ratio, temperature, and applied pressure. A maximum conductivity at room temperature for oriented PANI films can be achieved up to 500 s/cm with conductivity anisotropy as high as 20 : 1. The temperature dependence of conductivity for both unoriented and oriented films at 77–300 K and applied pressure of 0–11.4 kbar is consistent with the 3‐D variable‐range hopping model; however, the hopping barrier of oriented films is one order magnitude lower than that of unoriented films. The mechanism of enhanced conductivity for oriented PANI films is discussed. © 1994 John Wiley & Sons, Inc.
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