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Application of the dynamic SIMS technique to the study of silicone release coatings
Author(s) -
Stein Judith,
Leonard Tracey M.,
Smith Gary A.
Publication year - 1991
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1991.070420827
Subject(s) - silicone , secondary ion mass spectrometry , adhesive , polymer , materials science , composite material , matrix (chemical analysis) , chemical engineering , ion , mass spectrometry , analytical chemistry (journal) , chemistry , chromatography , organic chemistry , layer (electronics) , engineering
Secondary ion mass spectrometry (SIMS) depth profiling has been used to determine elemental compositions of cured silicone release coatings as well as the location of controlled release additives (CRAs) in the cured polymer matrix. The two CRAs examined were found to be uniformly distributed throughout the matrix with no apparent increase at either the air or adhesive interface. As CRAs are required for tight release, this suggests that a minimum concentration at the surface is necessary but this concentration is not greater than that found in the bulk.