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X‐ray diffraction studies in resins: Effect of entanglements and chain structure
Author(s) -
Swarup S.,
Nigam A. N.
Publication year - 1990
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1990.070390810
Subject(s) - epoxy , alkyd , diffraction , materials science , benzene , dielectric , stiffness , composite material , polymer chemistry , carbon fibers , chain (unit) , crystallography , chemistry , organic chemistry , physics , optics , composite number , optoelectronics , astronomy , coating
X‐ray diffraction halo of alkyd, amino, and epoxy resins were recorded. The effective d obtained from them was used to estimate certain physical parameters like cross‐sectional area, number of carbon atoms per chain, and stiffness parameters from the empirical curves of Boyer and Miller. Amino resin was found to behave differently than the rest of the resins which have a benzene ring in their backbone. These ideas find a confirmation from the ultrasonic and dielectric measurements performed on these very samples.