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The density and composition of polyimide surface layers
Author(s) -
Chauvin C.,
Sacher E.,
Yelon A.
Publication year - 1986
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1986.070310223
Subject(s) - polyimide , materials science , composite material , impurity , composition (language) , surface (topology) , infrared , layer (electronics) , analytical chemistry (journal) , optics , chemistry , chromatography , geometry , organic chemistry , linguistics , philosophy , mathematics , physics
Density measurements as a function of polyimide film thickness have revealed that the surface layers, each 1.5 μm in thickness, have a density lower than that of the bulk by a statistically significant 1%. Infrared measurements have confirmed that this is due to the presence of isoimide in these surface layers: because of its nonlinear nature, this impurity structure causes a decrease in the measured density.