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Ionic heterogeneities in sulfonated polysulfone films
Author(s) -
Sivashinsky N.,
Tanny G. B.
Publication year - 1983
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1983.070281018
Subject(s) - polysulfone , small angle x ray scattering , transmission electron microscopy , materials science , scattering , ionic bonding , glass transition , chemical engineering , analytical chemistry (journal) , chemical physics , ion , polymer , composite material , optics , nanotechnology , chemistry , chromatography , physics , organic chemistry , engineering
Measurements of glass transition temperature, small‐angle x‐ray scattering (SAXS), and transmission electron microscopy (TEM) have been applied to the study of ionic heterogeneities in sulfonated polysulfone (SPS) films. The SAXS study confirms the existence of heterogeneities in the electron density distribution, whose appearence for the Cs +1 , Ca +2 , and Fe +3 forms of SPS but not for H + suggests that the scattering centers are ion‐containing regions. However, a TEM study could not detect the existence of microseparated regions down to a level of 50 Å and the T g behavior as a function of IEC was more typical of that for random copolymers. A Mössbauer study, performed earlier by Heitner‐Wirguin et al. on samples of our material, indicated the existence of clusters ∼35–40 Å in diameter.