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Quantitative analysis of polymer blends using breadths of overlapping x‐ray diffraction lines
Author(s) -
Chidambareswaran P. K.,
Sreenivasan S.,
Patil N. B.,
Sundaram V.
Publication year - 1980
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1980.070250902
Subject(s) - diffraction , materials science , lapping , polymer , x ray crystallography , powder diffraction , x ray , chemical engineering , composite material , crystallography , optics , chemistry , physics , engineering
A method is developed to estimate the composition of a powder mixture using breadths of over‐lapping x‐ray diffraction (XRD) lines. The application of the method is illustrated for analyzing blends of cotton and jute.