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X‐ray studies on cellophane 1
Author(s) -
Venkateswaran A.
Publication year - 1969
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1969.070131119
Subject(s) - cellophane , materials science , intensity (physics) , x ray , polymer chemistry , mineralogy , composite material , chemistry , optics , physics
X‐Ray diffractograms of cellophane showed a considerable variation in the intensity corresponding to the 101, 101, and 002 planes. Applications of generally accepted procedures for estimating crystalline content in cellulosic materials yields varying results for crystallimity in cellophane. It is concluded that such procedures are not applicable to cellophane used in this study.