Premium
Characterization of nylon 66 structure from x‐ray diffraction
Author(s) -
Dumbleton J. H.,
Buchanan D. R.,
Bowles B. B.
Publication year - 1968
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1968.070120909
Subject(s) - characterization (materials science) , nylon 6 , diffraction , materials science , fiber diffraction , perpendicular , x ray , crystal structure , x ray crystallography , fiber , composite material , crystallography , optics , polymer , chemistry , geometry , mathematics , nanotechnology , physics
A description of methods available for the determination of structural parameters in nylon 66 is given for both wide‐ and small‐angle x‐ray diffraction. The methods are applied to a series of drawn nylon 66 fibers, and the results indicate that the drawing process is one of crystal slip. It is concluded that the methods of characterization give a great deal of information about the structure along the fiber axis but that methods for examining the structure perpendicular to the fiber axis give less quantitative information and new methods are desirable.