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Identification of deformation behavior in high‐thermal‐resistant poly(acrylonitrile‐butadiene‐styrene) (ABS)
Author(s) -
Jar P.Y. Ben,
Lee R.,
Creagh D. C.,
Konishi K.,
Shinmura T.
Publication year - 2001
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.1556
Subject(s) - small angle x ray scattering , materials science , crazing , acrylonitrile butadiene styrene , composite material , transmission electron microscopy , deformation (meteorology) , scattering , polymer , optics , nanotechnology , physics
Deformation mechanisms in postfractured high‐thermal‐resistant poly(acrylonitrile‐butadiene‐styrene) (ABS) were investigated using transmission electron microscopy (TEM) and small‐angle X‐ray scattering (SAXS). Although crazes were clearly identified by TEM, they were not detectable by SAXS. This was possibly due to a short distance between sample and imaging plate in the SAXS set‐up and invisibility of craze fibril scattering from the postfractured samples. A rhomboid‐shaped SAXS pattern was obtained from ABS samples with high ductility but with no crazes shown in the TEM micrographs. It is believed that the rhomboid‐shaped SAXS pattern was generated from matrix shear yielding. The results show that a combination of TEM and SAXS enable us to distinguish crazing and shear yielding in the postfractured ABS. © 2001 John Wiley & Sons, Inc. J Appl Polym Sci 81: 1316–1321, 2001