Premium
Morphological parameters in varieties of silk fibers determined by small‐angle X‐ray scattering
Author(s) -
Londono J. David,
Annadurai V.,
Gopalkrishne Urs R.,
Somashekar R.
Publication year - 2002
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.10873
Subject(s) - paracrystalline , silk , small angle x ray scattering , scattering , materials science , amorphous solid , synthetic fiber , phase (matter) , composite material , natural fiber , fiber , exponential function , polymer science , polymer chemistry , crystallography , optics , chemistry , physics , mathematics , mathematical analysis , organic chemistry
The small‐angle X‐ray scattering intensity data recorded from silk fibers were compared with the simulated data obtained from a linear paracrystalline model. For this purpose, an exponential distribution function for the amorphous and crystalline phase lengths was used. There are significant changes in phase lengths because of amino acid compositional changes in different families of silk fibers. © 2002 Wiley Periodicals, Inc. J Appl Polym Sci 85: 2382–2388, 2002