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Molecular orientation in the surface layer of polytetrafluorinethylene
Author(s) -
Aleinik A. I.,
Saydov G. V.
Publication year - 2001
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/app.10140
Subject(s) - reflection (computer programming) , macromolecule , materials science , layer (electronics) , polymer , attenuated total reflection , composite material , surface layer , deformation (meteorology) , orientation (vector space) , polymer science , polymer chemistry , chemistry , infrared spectroscopy , organic chemistry , geometry , biochemistry , mathematics , computer science , programming language
Attenuated total reflectance spectroscopy was used to study the orientation and deformation of molecular chains in polymers. Reflection and transmission spectra of the polytetrafluorinethylene (PTFE) films were obtained. Parameters of the macromolecule's degree of order were determined for the whole volume and for the surface layer of uniaxially orientated PTFE, and on this basis, we determined the character of dependence l SL ( L ), where l SL is the effective thickness of the surface layer and L is the film stretching degree. © 2002 Wiley Periodicals, Inc. J Appl Polym Sci 83: 1596–1599, 2002