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Application of fine crystal adhesion to growth acceleration of NaCl seed crystal—effect of number ratio of fine crystals on growth phenomena
Author(s) -
Wada Yoshinari,
Matsumoto Masakazu,
Onoe Kaoru
Publication year - 2012
Publication title -
asia‐pacific journal of chemical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.348
H-Index - 35
eISSN - 1932-2143
pISSN - 1932-2135
DOI - 10.1002/apj.1637
Subject(s) - crystal (programming language) , seed crystal , crystallization , supersaturation , crystal growth , materials science , growth rate , aqueous solution , solubility , crystallography , analytical chemistry (journal) , chemistry , single crystal , chromatography , mathematics , geometry , organic chemistry , computer science , programming language
With the use of fine crystal adhesion to seed crystals, a crystallization technique that enables to increase the growth rate of seed crystals was developed. For the crystallization of sodium chloride (NaCl) in which temperature dependence of solubility for an aqueous solution is low, the seed crystal number was set among 200–2.7 × 10 6 kg −1 , and the fine crystal number was varied in the range from 0.7×10 6 to 2.7×10 6 kg −1 by mixing the unsaturated solution into the supersaturated solution. The effects of the number ratio of fine crystals based on seed crystal number on growth phenomena of fine and seed crystals were investigated. The seed crystal surface was observed using a microscope technique. When the number ratio of fine crystals was varied among 1.0–2.1 × 10 4 , the growth rate of seed crystals showed an increasing tendency with an increase in the number ratio of fine crystals. Furthermore, the number of seed crystals was up to 2.7 × 10 6 kg −1 : the surface smoothness of seed crystal was increased with decreasing the number ratio of fine crystals. The rate constant of seed crystal growth showed an increasing relation against the logarithmic value of the number ratio of fine with seed crystals. © 2012 Curtin University of Technology and John Wiley & Sons, Ltd.