Premium
Synthesis and physico‐chemical studies of double alkoxides and their allied compounds
Author(s) -
Athar Taimur,
Kwon Jeong Oh,
Seok Sang Il
Publication year - 2005
Publication title -
applied organometallic chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.53
H-Index - 71
eISSN - 1099-0739
pISSN - 0268-2605
DOI - 10.1002/aoc.934
Subject(s) - thermogravimetric analysis , chemistry , alkoxide , crystallization , differential thermal analysis , differential scanning calorimetry , stoichiometry , scanning electron microscope , crystallite , solubility , thermal analysis , thermal decomposition , chemical engineering , mass spectrometry , fourier transform infrared spectroscopy , analytical chemistry (journal) , organic chemistry , diffraction , thermal , crystallography , catalysis , materials science , chromatography , physics , meteorology , optics , composite material , thermodynamics , engineering
Alkoxide‐based molecular routes used as single‐source precursors for the synthesis of ultrafine materials with correct stoichiometry ratios have become an area of intense scientific interest due to the technological relevance in terms of simple equipment, low‐temperature processing and low cost. The crystallization behavior of allied compounds can be controlled with the help of tuning the properties of different chelating agents in the reaction conditions to increase the solubility of metal alkoxides. Physico‐chemical studies of alkoxides and their derivatives were carried out using FTIR, NMR, mass spectrometry, thermogravimetric analysis (TGA)–differential thermal analysis (DTA) and scanning electron microscopy (SEM). The mass spectra show the same types of fragmentation pattern in the compounds. The X‐ray diffraction patterns show enhanced homogeneity. TGA–DTA measurements show that thermal decomposition occurs in steps and depends entirely on the chemical composition and the synthesis route. The SEM observations reveal a high microstructural uniformity of polycrystalline nature. Copyright © 2005 John Wiley & Sons, Ltd.