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Cadmium O ‐alkylxanthates as CVD precursors of CdS: a chemical characterization
Author(s) -
Barreca Davide,
Gasparotto Alberto,
Maragno Cinzia,
Seraglia Roberta,
Tondello Eugenio,
Venzo Alfonso,
Krishnan Venkata,
Bertagnolli Helmut
Publication year - 2005
Publication title -
applied organometallic chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.53
H-Index - 71
eISSN - 1099-0739
pISSN - 0268-2605
DOI - 10.1002/aoc.833
Subject(s) - chemistry , chemical vapor deposition , characterization (materials science) , raman spectroscopy , fourier transform infrared spectroscopy , cadmium sulfide , mass spectrometry , analytical chemistry (journal) , absorption (acoustics) , infrared , chemical structure , thin film , molecule , chemical engineering , inorganic chemistry , organic chemistry , nanotechnology , optics , chromatography , materials science , engineering , physics
Cadmium bis( O ‐alkylxanthates) are potential single‐source molecular precursors for the chemical vapor deposition (CVD) of Cd(II) sulfide thin films. In this work, a multi‐technique characterization of Cd( O ‐RXan) 2 compounds [where O ‐RXan is CH 3 CH 2 OCS 2 ( O ‐EtXan) or (CH 3 ) 2 CHOCS 2 ( O ‐ i PrXan)] is performed by means of several analytical methods (extended x‐ray absorption fine structure, Raman, Fourier transform infrared and optical absorption, spectroscopics 1 H and 13 C NMR, thermal analysis and mass spectrometry) for a thorough investigation of their structure and chemical–physical properties. The most important results concerning the chemical behavior under different experimental conditions, with particular attention to relevant properties for CVD applications, are presented and discussed. Copyright © 2005 John Wiley & Sons, Ltd.