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Back Cover: Structural Changes during the Growth of Atomically Precise Metal Oxido Nanoclusters from Combined Pair Distribution Function and Small‐Angle X‐ray Scattering Analysis (Angew. Chem. Int. Ed. 37/2021)
Author(s) -
Anker Andy S.,
Christiansen Troels Lindahl,
Weber Marcus,
Schmiele Martin,
Brok Erik,
Kjær Emil T. S.,
Juhás Pavol,
Thomas Rico,
Mehring Michael,
Jensen Kirsten M. Ø.
Publication year - 2021
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.202107902
Subject(s) - nanoclusters , scattering , small angle x ray scattering , cover (algebra) , crystallography , bismuth , oxide , materials science , metal , chemical physics , physics , molecular physics , chemistry , nanotechnology , optics , metallurgy , mechanical engineering , engineering
By combining X‐ray total scattering and small‐angle X‐ray scattering, it is possible to obtain unique insight into the formation of atomically precise nanoclusters. In a study of bismuth oxide clusters on page 20407, Michael Mehring, Kirsten M. Ø. Jensen et al. investigate the formation of [Bi 38 O 45 ] clusters from [Bi 6 O 8 ], and show that an intermediate structure of [Bi 22 O 26 ] plays an important role in the process. This intermediate structure was identified through a new automated modelling approach.
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