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SERS Activity of Semiconductors: Crystalline and Amorphous Nanomaterials
Author(s) -
Wang Xiaotian,
Guo Lin
Publication year - 2020
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.201913375
Subject(s) - semiconductor , nanotechnology , nanomaterials , materials science , raman scattering , amorphous semiconductors , raman spectroscopy , characterization (materials science) , semiconductor materials , optoelectronics , thin film , physics , optics
Surface‐enhanced Raman scattering (SERS) spectroscopy on semiconductors has attracted increasing attention due to its high spectral reproducibility and unique selectively to target molecules. Recently, endeavors have been made in fabricating novel SERS‐active semiconductor substrates and exploring new enhancement mechanisms to improve the sensitivity of semiconductor substrates. This Minireview explains the enhancement mechanism of the semiconductor SERS effect in a brief tutorial and summarize recent developments of novel semiconductor substrates, in particular with regard to the remarkable SERS activity of amorphous semiconductor nanomaterials. Potential applications of semiconductor SERS are also a key issue of concern. We discuss a variety of promising applications of semiconductor SERS in the fields of in situ analytical chemistry, spectroelectrochemical analysis, biological sensing, and trace detection.