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Inside Back Cover: Intrinsic Correlation between Electronic Structure and Degradation: From Few‐Layer to Bulk Black Phosphorus (Angew. Chem. Int. Ed. 12/2019)
Author(s) -
Kim Minju,
Kim Hangyu,
Park Soohyung,
Kim Jin Sung,
Choi Hyoung Joon,
Im Seongil,
Lee Hyunbok,
Kim Taekyeong,
Yi Yeonjin
Publication year - 2019
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.201900406
Subject(s) - black phosphorus , degradation (telecommunications) , layer (electronics) , cover (algebra) , phosphorus , molecule , int , chemistry , oxygen , scanning electron microscope , chemical physics , materials science , crystallography , chemical engineering , nanotechnology , optoelectronics , composite material , telecommunications , organic chemistry , computer science , mechanical engineering , engineering , operating system
Electron transfer from black phosphorus (BP) to oxygen molecules is an essential step in the degradation of BP. This process was analyzed by scanning Kelvin probe microscopy and interpreted by considering the Marcus–Gerischer theory. In their Communication on page 3754 ff., T. Kim, Y. Yi, and co‐workers demonstrate that the degradation processes of BP are intrinsically correlated with the layer‐dependent electronic structure of BP.