Single‐Nanoparticle Collision Events: Tunneling Electron Transfer on a Titanium Dioxide Passivated n‐Silicon Electrode | Zendy

Ahn Hyun S. | Zendy; Bard Allen J. | Zendy

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Single‐Nanoparticle Collision Events: Tunneling Electron Transfer on a Titanium Dioxide Passivated n‐Silicon Electrode

Author(s) -

Ahn Hyun S.,

Bard Allen J.

Publication year - 2015

Publication title -

angewandte chemie international edition

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 5.831

H-Index - 550

eISSN - 1521-3773

pISSN - 1433-7851

DOI - 10.1002/anie.201506963

Subject(s) - photocurrent , electrode , materials science , silicon , electron transfer , amorphous silicon , silicon dioxide , amorphous solid , cathode , titanium , electron , quantum tunnelling , anode , dark current , atomic physics , nanotechnology , optoelectronics , chemistry , crystalline silicon , photochemistry , composite material , physics , metallurgy , organic chemistry , quantum mechanics , photodetector

Single‐nanoparticle collisions were observed on an n‐type silicon electrode (600 μm diameter) passivated by a thin layer of amorphous TiO 2 , where the current steps occurred by tunneling electron transfer. The observed collision frequency was in reasonable agreement with that predicted from theory. The isolated electrode, after a collision experiment, with a Pt/TiO 2 /n‐Si architecture was shown to retain the photoelectrochemical properties of n‐Si without photocorrosion or current decay. The Pt/TiO 2 /n‐Si electrode produced 19 mA cm −2 of photocurrent density under 100 mW cm −2 irradiation from a xenon lamp during oxygen evolution without current fading for over 12 h.

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