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Probing the Charge Build‐Up and Dissipation on Thin PMMA Film Surfaces at the Molecular Level by XPS
Author(s) -
Yilmaz Eda,
Sezen Hikmet,
Suzer Sefik
Publication year - 2012
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.201201351
Subject(s) - x ray photoelectron spectroscopy , charge (physics) , dissipation , thin film , methyl methacrylate , materials science , analytical chemistry (journal) , chemical physics , chemical engineering , chemistry , physics , nanotechnology , polymer , organic chemistry , nuclear magnetic resonance , composite material , engineering , quantum mechanics , polymerization
What's the charge? X‐ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build‐up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to around −2 V and becomes progressively positively charged during the course of the XPS analysis.