Probing the Charge Build‐Up and Dissipation on Thin PMMA Film Surfaces at the Molecular Level by XPS | Zendy

Yilmaz Eda | Zendy; Sezen Hikmet | Zendy; Suzer Sefik | Zendy

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Probing the Charge Build‐Up and Dissipation on Thin PMMA Film Surfaces at the Molecular Level by XPS

Author(s) -

Yilmaz Eda,

Sezen Hikmet,

Suzer Sefik

Publication year - 2012

Publication title -

angewandte chemie international edition

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 5.831

H-Index - 550

eISSN - 1521-3773

pISSN - 1433-7851

DOI - 10.1002/anie.201201351

Subject(s) - x ray photoelectron spectroscopy , charge (physics) , dissipation , thin film , methyl methacrylate , materials science , analytical chemistry (journal) , chemical physics , chemical engineering , chemistry , physics , nanotechnology , polymer , organic chemistry , nuclear magnetic resonance , composite material , engineering , quantum mechanics , polymerization

What's the charge? X‐ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build‐up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to around −2 V and becomes progressively positively charged during the course of the XPS analysis.

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