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The Significance of Ionic Bonding in Sulfur Dioxide: Bond Orders from X‐ray Diffraction Data
Author(s) -
Grabowsky Simon,
Luger Peter,
Buschmann Jürgen,
Schneider Thomas,
Schirmeister Tanja,
Sobolev Alexandre N.,
Jayatilaka Dylan
Publication year - 2012
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.201200745
Subject(s) - ionic bonding , diffraction , sulfur , x ray crystallography , x ray , bond , sulfur dioxide , crystallography , bond length , computer science , chemistry , physics , crystal structure , inorganic chemistry , organic chemistry , ion , optics , business , finance
A novel refinement technique for X‐ray diffraction data has been employed to derive SO bond orders in sulfur dioxide experimentally. The results show that ionic SO bonding dominates over hypervalency.
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