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Imaging MoS 2 Nanocatalysts with Single‐Atom Sensitivity
Author(s) -
Kisielowski Christian,
Ramasse Quentin M.,
Hansen Lars P.,
Brorson Michael,
Carlsson Anna,
Molenbroek Alfons M.,
Topsøe Henrik,
Helveg Stig
Publication year - 2010
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200906752
Subject(s) - nanomaterial based catalyst , atom (system on chip) , enhanced data rates for gsm evolution , nanotechnology , sensitivity (control systems) , content (measure theory) , computer science , crystallography , materials science , analytical chemistry (journal) , information retrieval , chemistry , engineering , artificial intelligence , nanoparticle , mathematics , organic chemistry , electronic engineering , parallel computing , mathematical analysis
Close up : The atomic arrangement of industrial‐style MoS 2 nanocatalysts can be scrutinized by using single‐atom‐sensitive electron microscopy (see picture). This technique, which provides an excellent agreement between simulation and experiment, allows element detection in compound materials and permits the type and the concentration of the catalytically important edge sites to be estimated.