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Far‐Field Nanodiagnostics of Solids with Visible Light by Spectrally Selective Imaging
Author(s) -
Naumov Andrei V.,
Gorshelev Alexey A.,
Vainer Yury G.,
Kador Lothar,
Köhler Jürgen
Publication year - 2009
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200905101
Subject(s) - diffraction , optics , limit (mathematics) , microscopy , materials science , field (mathematics) , physics , mathematics , mathematical analysis , pure mathematics
Cracking up : Use of conventional microscopy allows the width of a crack in a crystal to be determined with an accuracy that is limited by classical diffraction (see picture, left‐hand image). Single‐molecule imaging methods enable the determination of the crack profile with an accuracy beyond the diffraction limit (right‐hand image).