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Label‐Free Chemical Imaging of Catalytic Solids by Coherent Anti‐Stokes Raman Scattering and Synchrotron‐Based Infrared Microscopy
Author(s) -
Kox Marianne H. F.,
Domke Katrin F.,
Day James P. R.,
Rago Gianluca,
Stavitski Eli,
Bonn Mischa,
Weckhuysen Bert M.
Publication year - 2009
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200904282
Subject(s) - raman scattering , synchrotron , raman spectroscopy , microscopy , infrared , materials science , thiophene , coherent anti stokes raman spectroscopy , chemical imaging , scattering , infrared microscopy , x ray raman scattering , optics , analytical chemistry (journal) , crystallography , chemistry , physics , organic chemistry , remote sensing , hyperspectral imaging , geology
Take a look inside : The combination of coherent anti‐Stokes Raman scattering and synchrotron‐based IR microscopy during the catalytic conversion of thiophene derivatives on zeolite crystals yields space‐ and time‐resolved chemically specific information without the need for labeling (see picture). The thiophene reactant is mostly present in the center of the crystal, and the product is aligned within the straight pores of the zeolites.