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Direct Imaging of the MoVTeNbO M1 Phase Using An Aberration‐Corrected High‐Resolution Scanning Transmission Electron Microscope
Author(s) -
Pyrz William D.,
Blom Douglas A.,
Vogt Thomas,
Buttrey Douglas J.
Publication year - 2008
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200705700
Subject(s) - scanning transmission electron microscopy , conventional transmission electron microscope , optics , materials science , phase (matter) , scanning electron microscope , high resolution transmission electron microscopy , microscope , transmission electron microscopy , resolution (logic) , transmission (telecommunications) , electron , scanning confocal electron microscopy , physics , computer science , telecommunications , nuclear physics , quantum mechanics , artificial intelligence
Seeing is believing : Aberration‐corrected STEM imaging allows direct visualization of the orthorhombic M1 phase primary component of the MoVNbTeO propane ammoxidation catalyst. Atomic coordinates and site occupancies are obtained, and the beam‐sensitive Te chains in the hexagonal and heptagonal channels are successfully imaged. These results suggest that HR‐HAADF imaging may provide improved starting models for Rietveld analysis of complex structures.