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Spectroscopy and High‐Resolution Microscopy of Single Nanocrystals by a Focused Ion Beam Registration Method
Author(s) -
Novo Carolina,
Funston Alison M.,
PastorizaSantos Isabel,
LizMarzán Luis M.,
Mulvaney Paul
Publication year - 2007
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200700033
Subject(s) - microscopy , materials science , focused ion beam , spectroscopy , nanocrystal , ion beam , resolution (logic) , ion , optics , high resolution , nanotechnology , beam (structure) , chemistry , physics , remote sensing , computer science , artificial intelligence , geology , organic chemistry , quantum mechanics
Telling FIBs : Identification of the exact size and shape of a nanoparticle is crucial for direct comparison of experimental results with theoretical predictions. A focused ion beam (FIB) registration method enables routine spectroscopic and high‐resolution microscopic experiments to be carried out on the same nanoparticle (see picture).