Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles | Zendy

Gontard Lionel Cervera | Zendy; Chang LanYun | Zendy; Hetherington Crispin J. D. | Zendy; Kirkland Angus I. | Zendy; Ozkaya Dogan | Zendy; DuninBorkowski Rafal E. | Zendy

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Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles

Author(s) -

Gontard Lionel Cervera,

Chang LanYun,

Hetherington Crispin J. D.,

Kirkland Angus I.,

Ozkaya Dogan,

DuninBorkowski Rafal E.

Publication year - 2007

Publication title -

angewandte chemie international edition

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 5.831

H-Index - 550

eISSN - 1521-3773

pISSN - 1433-7851

DOI - 10.1002/anie.200604811

Subject(s) - nanoparticle , transmission electron microscopy , computation , carbon black , materials science , high resolution transmission electron microscopy , optics , spherical aberration , catalysis , transmission (telecommunications) , nanotechnology , physics , computer science , chemistry , algorithm , telecommunications , composite material , biochemistry , natural rubber , lens (geology)

Picture perfect : Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical‐aberration‐corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration).

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