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Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles
Author(s) -
Gontard Lionel Cervera,
Chang LanYun,
Hetherington Crispin J. D.,
Kirkland Angus I.,
Ozkaya Dogan,
DuninBorkowski Rafal E.
Publication year - 2007
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200604811
Subject(s) - nanoparticle , transmission electron microscopy , computation , carbon black , materials science , high resolution transmission electron microscopy , optics , spherical aberration , catalysis , transmission (telecommunications) , nanotechnology , physics , computer science , chemistry , algorithm , telecommunications , composite material , biochemistry , natural rubber , lens (geology)
Picture perfect : Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical‐aberration‐corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration).