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A Revolution in Electron Microscopy
Author(s) -
Thomas John Meurig
Publication year - 2005
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200501466
Subject(s) - electron microscope , microscopy , amorphous solid , materials science , electron diffraction , energy filtered transmission electron microscopy , reflection high energy electron diffraction , diffraction , nanotechnology , optics , chemistry , crystallography , physics , scanning transmission electron microscopy
Ultrafast electron microscopy is a versatile technique that allows images and diffraction patterns of crystalline and amorphous materials as well as images of biological cells to be measured (see picture). Advances in the domain of time‐resolved electron microscopy and the potential of the technique in various applications are discussed.