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Ultrafast Electron Crystallography of Surface Structural Dynamics with Atomic‐Scale Resolution
Author(s) -
Vigliotti Franco,
Chen Songye,
Ruan ChongYu,
Lobastov Vladimir A.,
Zewail Ahmed H.
Publication year - 2004
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/anie.200453983
Subject(s) - electron crystallography , electron diffraction , atomic units , ultrafast electron diffraction , ultrashort pulse , diffraction , reflection high energy electron diffraction , crystallography , resolution (logic) , electron , materials science , substrate (aquarium) , surface (topology) , chemistry , chemical physics , optics , physics , computer science , mathematics , geometry , laser , quantum mechanics , artificial intelligence , oceanography , geology
A formidable contender to X‐ray diffraction is ultrafast electron crystallography. Whereas the former is more suited to investigate the bulk of the substrate, the time, length, and sensitivity scales of electron crystallography provide powerful and complementary information on atomic‐scale structural dynamics at the surface (see diffraction image of GaAs crystal).