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Reactions of Silyllithium with C 60 : Isolation and X‐ray Crystallographic Characterization of an Unusual Bissilylated‐C 60 Adduct
Author(s) -
Kusukawa Takahiro,
Ando Wataru
Publication year - 1996
Publication title -
angewandte chemie international edition in english
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 0570-0833
DOI - 10.1002/anie.199613151
Subject(s) - characterization (materials science) , crystallography , adduct , x ray , x ray crystallography , materials science , chemistry , nanotechnology , physics , diffraction , organic chemistry , quantum mechanics , optics
Two silyl substituents without additional H substituents are the features of the bisadducts 1 , which are selectively obtained by the reactions of silyllithium compounds 2 with C 60 . The single‐crystal X‐ray analysis of 1a confirms 1,16 or 1,29 addition.