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Book Review: Electronics Reliability and Measurement Technology—Non‐Destructive Evaluation. Edited by Joseph S. Heyman
Author(s) -
Reiner Hans
Publication year - 1989
Publication title -
angewandte chemie international edition in english
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 0570-0833
DOI - 10.1002/anie.198915941
Subject(s) - citation , reliability (semiconductor) , computer science , library science , physics , power (physics) , quantum mechanics
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