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Surface Analysis I: Imaging Surfaces, Electric Charges and Magnetic Domains with the Atomic Force Microscope
Author(s) -
Rabe Jürgen P.
Publication year - 1989
Publication title -
angewandte chemie international edition in english
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 0570-0833
DOI - 10.1002/anie.198915781
Subject(s) - atomic force microscopy , magnetic force microscope , surface (topology) , atomic units , conductive atomic force microscopy , nanotechnology , kelvin probe force microscope , materials science , molecule , physics , magnetic field , quantum mechanics , magnetization , geometry , mathematics
Research News: Surface Analysis I. Atomic Force Microscopy (AFM) provides a method of imaging surfaces on an atomic scale. Closely related to STM, AFM can, however, image insulating materials such as organic molecules. The technique is described and some recent applications discussed in the first article of a regular series from Jürgen Rabe on surface analysis techniques.