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IR Emission Analysis of Temperature Profiles in Pt/SiO 2 Catalysts during Exothermic Reactions
Author(s) -
Georgiades George,
Self Valerie A.,
Sermon Paul A.
Publication year - 1987
Publication title -
angewandte chemie international edition in english
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 0570-0833
DOI - 10.1002/anie.198710421
Subject(s) - catalysis , exothermic reaction , atmospheric temperature range , crystallite , cyclohexene , materials science , kinetic energy , analytical chemistry (journal) , chemistry , chemical engineering , inorganic chemistry , thermodynamics , organic chemistry , metallurgy , physics , engineering , quantum mechanics
During H 2 oxidation and cyclohexene hydrogenation on Pt/SiO 2 heterogenous catalysts, the temperature of the Pt crystallite can be much higher than that of the SiO 2 support. The extent of this temperature rise depends on the reaction. There is a wide range of temperatures on the catalyst particles, but these temperatures remain stable during the reaction. These findings, obtained by IR emission spectroscopy, are of importance for the kinetic analysis of heterogeneously catalyzed reactions.