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Imaging and Analysis of Surfaces with a Scanning Electron Microscope and Electron Spectrometer
Author(s) -
Holm Reimer
Publication year - 1971
Publication title -
angewandte chemie international edition in english
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 0570-0833
DOI - 10.1002/anie.197105911
Subject(s) - auger electron spectroscopy , scanning electron microscope , materials science , passivation , electroplating , coating , electron , electron microscope , adsorption , optics , corrosion , spectrometer , analytical chemistry (journal) , nanotechnology , layer (electronics) , chemistry , metallurgy , physics , composite material , chromatography , organic chemistry , quantum mechanics , nuclear physics
The topography and the composition of a surface are in many cases of equal importance (catalysis, electroplating, pretreatment of foils and sheet metal, corrosion, passivation, adsorption, coating of fibers, etc.), and this explains the great interest in methods of investigation that reveal both. If the demands on the resolving power, the analytical possibilities, and the thickness of the surface layer are not too exacting, combined devices like the scanning electron microscope and its analytical accessories can be used. When it is necessary to avoid the compromises involved in simultaneous imaging and analysis, the investigations must be carried out with separate equipment. As an example of a method for the analysis of surfaces we consider briefly photo‐ and Auger electron spectroscopy (ESCA).