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Peak Force Infrared–Kelvin Probe Force Microscopy
Author(s) -
Jakob Devon S.,
Wang Haomin,
Zeng Guanghong,
Otzen Daniel E.,
Yan Yong,
Xu Xiaoji G.
Publication year - 2020
Publication title -
angewandte chemie
Language(s) - English
Resource type - Journals
eISSN - 1521-3757
pISSN - 0044-8249
DOI - 10.1002/ange.202004211
Subject(s) - kelvin probe force microscope , infrared , nanoscopic scale , microscopy , photothermal therapy , chemistry , infrared microscopy , nanotechnology , nanomaterials , scanning probe microscopy , resolution (logic) , electrostatic force microscope , materials science , analytical chemistry (journal) , optics , atomic force microscopy , physics , chromatography , artificial intelligence , computer science
Abstract Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR‐KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single‐pass scan. MAPbBr 3 perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr 3 near the boundary to PbBr 2 . PFIR‐KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR‐KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.